SpringerExperimentalApplicationsExamplesApplicationReviewSTUDIESSURFACESurfacesIntroductionScatteringEffectsDiscussionEnergyElectronicFormationMEANSKelvin Probe Force MicroscopyThicknessProperties
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vol.51 (2013)
vol.48 (2012)
vol.47 (2011)
vol.46 (2011)
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Yuan, YuehuaLee, T. Randall
Lytken, OleDrescher, Hans-JörgKose, RickmerGottfried, J. Michael
Allara, DavidStapleton, Josh
Canepa, Maurizio
Richter, Lee J.
Sakata, OsamiNakamura, Masashi
Gibaud, A.Chebil, M.S.Beuvier, T.
Verdini, AlbertoKrüger, PeterFloreano, Luca
Zegenhagen, Jörg
Nefedov, AlexeiWöll, Christof
Ott, Frédéric
Holst, BodilBracco, Gianangelo
Jardine, Andrew
Farías, DanielMinniti, MarinaMiranda, Rodolfo
Esaulov, Vladimir A.
Maas, Diederik J.Van Gastel, Raoul
Vattuone, LucaSavio, LetiziaRocca, Mario
de la Figuera, JuanMcCarty, Kevin F.
Della Pia, AdaCostantini, Giovanni
Lyles, Venetia D.Serem, Wilson K.Yu, Jing-JiangGarno, Jayne C.
2013年01期
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