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搜期刊

Micron EI PubMed SCIE JCR:Q1 中科院3区
发文量 4,574
被引量 71,464
影响因子(2023) 2.075

Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal publishes research papers on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on light optical, electron-beam, X-ray microtomography, ion microscopy and scanning-probe imaging. It also carries review papers, short communications, thematic issues on contemporary developments in microscopy & microanalysis, as well as tutorial papers describing microscopy techniques for current practitioners or newcomers in the field. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering. Authors are encouraged to contact one of the Editors directly to discuss Review or Tutorial proposals: https://www.journals.elsevier.com/micron/editorial-board Benefits to authors We provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. . Micron enables researchers to rapidly share their most exciting work with their colleagues. The expected time from submission to final decision is approximately 5 weeks. The journal does not have page limits, so supplementary text is unnecessary and should be avoided. Authors are encouraged to deposit supplementary materials during submission, e.g. videos and research data, in a relevant data repository such as Mendeley Data and cite and link to this dataset in their article. There are several ways you can share your data, which helps you get credit for your work and make your data accessible and discoverable for your peers. To deposit your data please follow the Research Data Guidelines. Note to the authors No changes in the list authors will be accepted during the review process or after acceptance unless such a claim is duly justified by the authors.

  • 主办单位: PERGAMON-ELSEVIER SCIENCE LTD
  • 出版地区: United Kingdom
  • 出版周期: 月刊
  • 别名: 微米
  • 国际标准连续出版物号: ISSN 0968-4328
  • 创刊时间: 1993年
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