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Reliability PhysicsSymposium ProceedingsNonvolatile MemoryNegative Bias Temperature InstabilityFloating GateData RetentionThreshold VoltageFlash Memory ArrayStatistical DistributionsFLASH MemoryDevice ReliabilityHuman Computer InteractionElectron TrapsTemperature DataFailure AnalysisLDMOS Power TransistorMicrowave DegradationWafer Level ReliabilityConvergent Beam Electron DiffractionHot Electron Stress