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X-Ray Photoelectron SpectroscopyAtomic Layer DepositionTransmission Electron MicroscopyFilm TransistorsThermal StabilityElectrical CharacteristicsScanning Electron MicroscopyThin FilmsDiffusion BarrierThreshold VoltageChemical Vapor DepositionThickness DependenceOptical PropertiesElectrical PerformanceX-Ray DiffractionIndium Tin OxidePhase Change MemoryCarbon NanotubesLow TemperatureGe Films
vol.4 (2015)
vol.4 (2014)
vol.3 (2014)
vol.2 (2013)
vol.1 (2012)