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文献信息
Polycrystalline SiliconMagnetic FieldCadmium TellurideSiliconLow TemperatureTransmission Electron MicroscopyElectrical CharacterizationFinite Element MethodThin FilmsMossbauer SpectrometrySOLARGrain BoundariesTunnel EffectRoom TemperatureExperimental DataElectric FieldSuperconducting PropertiesCritical CurrentX-Ray DiffractionCharacterization
vol.7 (1997)
vol.6 (1996)
vol.5 (1995)
vol.4 (1994)