Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques is a peer-reviewed journal that publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal has the aim to become an international publication and publishes manuscripts originally submitted in English from all countries along with translated works. The peer review policy of the journal is independent of the manuscript source, ensuring a fair and unbiased evaluation process for all submissions.